ARLA/CLUSTER: RF Back to Basics: Part 2 - Signal Analysis

[João Condeço]

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*Innovations in Signal Generation and Analysis Webcast Series*  *Title: RF
Back to Basics: Part 2 - Signal
Generation<http://mwjournalemails.com/portal/wts/cgmcoAaN-SDbaSntDh8gjdbeeM7Aa>
*

*Date:* February 29, 2012
*Time:* 10 AM PT/ 1 PM ET/ 6 PM UTC
*Presented by:* Agilent Technologies
*Presenter:* Erik Diez, *Senior Product Manager*, Agilent Technologies

*Webcast Description:*

Signal generators are a fundamental test tool that engineers use for a wide
variety of RF and microwave measurements. This presentation will cover the
basic architecture and theory of operation of modern signal generators,
analog and digital modulation fundamentals, and sources of uncertainty that
can limit measurement performance. We will also discuss how signal
generators can be used in various measurement applications ranging from
device test and receiver test to signal simulation.

 *Register Here*<http://mwjournalemails.com/portal/wts/cgmcoAaN-SDbaSntDh8gjebeeM7Aa>

Presented by:
[image: Agilent Technologies]

*Erik Diez* is a Senior Product Manager in the Agilent Technologies
Microwave and Communications Division in Santa Rosa, California. In his
32-year career with the company, he has held numerous roles in marketing,
R&D, and application engineering related to a variety of signal analysis
and generation products. Erik holds a BSEE from UC Davis and an MSEE from
UC Berkeley.



 [image: Erik Diez]  *Erik Diez*
*Senior Product Manager,* Agilent Technologies


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73's
João Condeço
CT2HPM
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